Thickness dependence of the ground-state properties of thin films of the heavy-fermion compound CeCu_6

Author(s):: Groten, D.; Baarle, G.J.C. van; Aarts, J. (0000-0002-4113-0835); Nieuwenhuys, G.J.; Mydosh, J.A.

Published: 2001
Publication type: Article / Letter to editor

Date issued: 2001
Language: English
Is part of: Physical Review B (2001), Vol. 64, p. 144425
hdl: 1887/44626
doi: 10.1103/PhysRevB.64.144425
URL: https://arxiv.org/abs/cond-mat/0107049