From transcript to insights: summarizing safety culture interviews with LLMs

Author(s):
Steijn, W.; Loo, J. van de; Beek, D. van der; Groeneweg, J.
Published
2025
Publication type
Article in monograph or in proceedings
Date issued
2025
Language
English
Is part of
International conference on measurement, AI, quality and sustainability (MAIQS 2025) (2025), Pt. 413
hdl
1887/4294478
doi
10.1051/matecconf/202541303003
URL
https://www.matec-conferences.org/articles/matecconf/abs/2025/07/matecconf_maiqs2025_03003/matecconf_maiqs2025_03003.html