Intrinsic charge trapping and reversible charge induced structural modifications in a-Si3N4

Author(s):: Hückmann, L. (0000-0003-4718-4604); Cottom, J.P. (0000-0002-5918-9464); Meyer, J. (0000-0003-0146-730X)

Published: 2023
Publication type: Dataset

Date issued: 2023-11-17
Language: English
hdl: 1887/4283567
doi: 10.5281/zenodo.8239086
URL: https://zenodo.org/records/8239086