METIS high-contrast imaging: from final design to manufacturing and testing
- Author(s):
- Absil, O.; Kenworthy, M.A. (0000-0002-7064-8270); Delacroix, C.; Orban de Xivry, G.; König, L.; Pathak, P.; Doelman, D.S. (0000-0003-0695-0480); Por, E.; Snik, F. (0000-0003-1946-7009); van den Born, J.; Cantalloube, F.; Carlotti, A.; Courtney-Barrer, B.; Forsberg, P.; Karlsson, M.; Bertram, T.; Boekel, R. van; Dolkens, D.; Feldt, M.; Glauser, A.M.; Pantin, E.; Quanz, S.P.; Bettonvil, F.C.M.; Brandl, B.R. (0000-0001-9737-169x)
- Editor(s):
- Bryant, J.J.; Motohara, K.; Vernet, J.R.
- Published
- 2024
- Publication type
- Article in monograph or in proceedings
- Date issued
- 2024
- Language
- English
- Is part of
- Proceedings of SPIE (2024), Pt. 13096, p. 1309652
- hdl
- 1887/4254671
- doi
- 10.1117/12.3019692
- URL
- https://ui.adsabs.harvard.edu/abs/2024SPIE13096E..52A
Review of
- Series
- Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series