Analyzing misalignment tolerances for implicit electric field conjugation

Author(s):: Liberman, J.; Haffert, S.Y. (0000-0001-5130-9153); Males, J.R.; Milani, K.

Editor(s):: Jackson, K.J.; Schmidt, D.; Vernet, E.

Published: 2024
Publication type: Article in monograph or in proceedings

Date issued: 2024
Language: English
Publisher: SPIE
Is part of: Proceedings of SPIE (2024), Pt. 13097, p. 130976J
ISBN source: 9781510675179
hdl: 1887/4251796
doi: 10.1117/12.3020247
URL: https://ui.adsabs.harvard.edu/abs/2024SPIE13097E..6JL

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Series: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series