Deep learning for istance retrieval: a survey
- Author(s):
- Chen, W.; Liu, Y.; Wang, W.; Bakker, E.M.; Georgiou, T.K. (0000-0003-3696-0049); Fieguth, P.W.; Liu, L.; Lew, M.S.K. (0000-0003-4353-1840)
- Published
- 2023
- Publication type
- Article / Letter to editor
- Date issued
- 2023
- Language
- English
- Is part of
- IEEE Transactions on Pattern Analysis and Machine Intelligence (2023), Vol. 45, no. 6, p. 7270-7292
- hdl
- 1887/4248372
- doi
- 10.1109/TPAMI.2022.3218591
