Intrinsic charge trapping and reversible charge induced structural modifications in a‐Si3N4

Author(s):: Hückmann, L. (0000-0003-4718-4604); Cottom, J.P. (0000-0002-5918-9464); Meyer, J. (0000-0003-0146-730X)

Published: 2023
Publication type: Article / Letter to editor

Date issued: 2023-11-16
Language: English
Publisher: Wiley
Is part of: Advanced Physics Research (2023), No. 2, 2300109
hdl: 1887/4082367
doi: 10.1002/apxr.202300109
Dataset: https://doi.org/10.5281/zenodo.8239086