Application of functional kernel hypothesis testing for channel selection in time series classification

Author(s):
Huang, Q.; Bäck, T.H.W. (0000-0001-6768-1478); Stein, N. van (0000-0002-0013-7969)
Published
2023
Publication type
Article in monograph or in proceedings
Time series analysisBenchmark testingActivity recognitionSensors
Date issued
2023-08-01
Language
English
Publisher
IEEE Computer Society
Is part of
2023 IEEE Conference on Artificial Intelligence (CAI) (2023), p. 245-247
ISBN source
9798350339840
hdl
1887/3762454
doi
10.1109/CAI54212.2023.00111
URL
https://ieeexplore.ieee.org/document/10195105

Conference

Meeting name
2023 IEEE Conference on Artificial Intelligence
Meeting location
Santa Clara, United States of America
Meeting date
2023-06-05 - 2023-06-06

Funding

Sponsorship
NWO
Grant number
19455