Evaluation of deep unsupervised anomaly detection methods with a data-centric approach for on-line inspection

Author(s):
Zeiser, A.; Özcan, B.; Stein, N. van (0000-0002-0013-7969); Bäck, T.H.W. (0000-0001-6768-1478)
Published
2023
Publication type
Article / Letter to editor
Additive manufacturingDeep unsupervised anomaly detectionDomain randomisationSynthetic dataInsitu monitoring
Date issued
2023
Language
English
Publisher
Elsevier BV
Is part of
Computers in Industry (2023), 103852
hdl
1887/3736355
doi
10.1016/j.compind.2023.103852
URL
https://www.sciencedirect.com/science/article/pii/S0166361523000027?via%3Dihub