A data-centric approach to anomaly detection in layer-based additive manufacturing

Author(s):
Zeiser, A.; Özcan, B.; Kracke, C.; Stein, N. van (0000-0002-0013-7969); Bäck, T.H.W. (0000-0001-6768-1478)
Published
2023
Publication type
Article / Letter to editor
Additive manufacturingAnomaly detectionDomain randomisationInfrared imaging
Date issued
2023-01-13
Language
English
Publisher
Walter de Gruyter GmbH
Is part of
at - Automatisierungstechnik (2023), Vol. 71, no. 1, p. 81-89
hdl
1887/3732015
doi
10.1515/auto-2022-0104