Deep BIAS: detecting structural bias using explainable AI
- Author(s):
- Stein, N. van (0000-0002-0013-7969); Vermetten, D.L. (0000-0003-3040-7162); Caraffini, F.; Kononova, A.V. (0000-0002-4138-7024)
- Published
- 2024
- Publication type
- Article in monograph or in proceedings
- Date issued
- 2024-03-07
- Language
- English
- Publisher
- New York, U.S.A.: Association for Computing Machinery
- Is part of
- GECCO '23 companion (2024), p. 455-458
- ISBN source
- 9798400701207
- hdl
- 1887/3721381
- doi
- 10.1145/3583133.3590551
Conference
- Meeting name
- GECCO '23 Companion: Companion Conference on Genetic and Evolutionary Computation
- Meeting location
- Lisbon, Portugal
- Meeting date
- 2023-07-15 - 2023-07-19
