Pixel super‐resolution interference pattern sensing via the aliasing effect for laser frequency metrology

Author(s):: Wan, L.; Yu, T.; Zhao, d.; Löffler, W. (0000-0001-6587-8947)

Published: 2023
Publication type: Article / Letter to editor

Date issued: 2023-07-19
Language: English
Publisher: Wiley
Is part of: Laser & Photonics Reviews (2023), No. 10, 2200994
hdl: 1887/3719366
doi: 10.1002/lpor.202200994
URL: http://dx.doi.org/10.1002/lpor.202200994