NimbleAI: towards neuromorphic sensing-processing 3D-integrated chips
- Author(s):
- Xabier, I.; Abderrahmane, N.; Abella, J.; Alcaide, S.; Beyne, E.; Charles, H.P.; Charpin, C; Chittka, L.; Dávilla, A.; Dev Gomony, M.; Erdmann, A.; Estrada, C.; Fernandez, A.; Fontanelli, A.; Flich, J; Hernan Gloriani, A.; Grosu, R.; Hernandez, C.; Ielmini, D.; Isusquiza, E.; Jackson, D.; Kooli, M.; Lepri, N.; Linares-Barranco, B.; Lachese, J.L.; Lasa, M.; Laurent, E.; Lindwer, M.; Linsenmaier, F.; Luján, M.; Masarik, K.; Mentens, N; Moreira, O.; Peres, L.; Noel, J.P.; Pourtaherian, A.; Posch, C.; Priller, P.; Prikryl, Z.; Resch, F.; Rhodes, O.; Stefanov, T.P. (0000-0001-6006-9366); Moritz, S.; Sander, S.; Taliercio, M.; Burgwal, M. van de; Plas, G. van der; Vianello, E.; Zaykovankd, P.
- Published
- 2023
- Publication type
- Article in monograph or in proceedings
- Date issued
- 2023-06-02
- Language
- English
- Publisher
- IEEE
- Is part of
- 2023 Design, Automation & Test in Europe conference & exhibition (DATE) (2023), p. 1-6
- ISBN source
- 9798350396249
- hdl
- 1887/3718577
- doi
- 10.23919/DATE56975.2023.10136952
Conference
- Meeting name
- 26th Int. Conf. Design, Automation and Test in Europe (DATE'23)
- Meeting location
- Antwerp
- Meeting date
- 2023-04-17 - 2023-04-19
