Low energy electron microscopy at cryogenic temperatures
- Author(s):
- Tebyani, A.; Schramm, S.M.; Hesselberth, M.B.S.; Boltje, D.B.; Jobst, J. (0000-0002-2422-1209); Tromp, R.M.; Molen, S.J. van der (0000-0003-3181-2055)
- Published
- 2023
- Publication type
- Article / Letter to editor
- Date issued
- 2023-11-01
- Language
- English
- Publisher
- Elsevier BV
- Is part of
- Ultramicroscopy (2023), 113815
- hdl
- 1887/3718521
- doi
- 10.1016/j.ultramic.2023.113815
