Back illuminated photo emission electron microscopy (BIPEEM)

Author(s):: Moradi, A. (0000-0003-3754-9200); Rog, M.; Stam, W.G.; Tromp, R.M.; Molen, S.J. van der (0000-0003-3181-2055)

Published: 2023
Publication type: Article / Letter to editor

Date issued: 2023-11-01
Language: English
Publisher: Elsevier BV
Is part of: Ultramicroscopy (2023), 113809
hdl: 1887/3718519
doi: 10.1016/j.ultramic.2023.113809