Extracting transverse electron mean free paths in graphene at low energy

Author(s):: Neu, P.S.; Geelen, D. (0000-0003-3571-3898); Tromp, R.M.; Molen, S.J. van der (0000-0003-3181-2055)

Published: 2023
Publication type: Article / Letter to editor

Date issued: 2023-06-20
Language: English
Publisher: Elsevier BV
Is part of: Ultramicroscopy (2023), 113800
hdl: 1887/3718517
doi: 10.1016/j.ultramic.2023.113800