Classification of yeast cells from image features to evaluate pathogen conditions

Author(s):: Putten, P.W.H. van der (0000-0002-6507-6896); Bertens, L.M.F. (0000-0001-9974-9887); Liu, J.; Hagen, F.; Boekhout, T.; Verbeek, F.J. (0000-0003-2445-8158)

Editor(s):: Hanjalic, A.; Schettini, R.; Sebe, N.

Published: 2007
Publication type: Article in monograph or in proceedings

Date issued: 2007
Language: English
Publisher: SPIE
Is part of: SPIE Proceedings (2007), Pt. 6506
hdl: 1887/3640123
doi: 10.1117/12.714072

Conference

Meeting name: MultiMedia Content Access: Algorithms & Systems