Feature selection for fault detection and prediction based on event log analysis

Author(s):
Zhong, L.; Leeuwen, M, van; Li, Z. (0000-0003-1124-5778)
Published
2022
Publication type
Article / Letter to editor
Date issued
2022-11-29
Language
English
Publisher
Association for Computing Machinery (ACM)
Is part of
ACM SIGKDD Explorations (2022), Vol. 24, no. 2, p. 96-104
hdl
1887/3570994
doi
10.1145/3575637.3575652