The High-contrast End-to-End Performance Simulator (HEEPS): influence of ELT/METIS instrumental effects

Author(s):: Delacroix, C.; Absil, O.; Orban de Xivry, G.; Shinde, M.; Pathak, P.; Cantalloube, F.; Carlomagno, B.; Christiaens, V.; Boné, A.; Dolkens, D.; Kenworthy, M.A. (0000-0002-7064-8270); Doelman, D.S. (0000-0003-0695-0480)

Editor(s):: Angeli, G.Z.; Dierickx, P.

Published: 2022
Publication type: Article in monograph or in proceedings

Date issued: 2022
Language: English
Publisher: Washington: Society of Photo-Optical Instrumentation Engineers
Is part of: Modeling, systems engineering, and project management for astronomy X (2022), Pt. 12187, p. 121870F
hdl: 1887/3513238
doi: 10.1117/12.2630341
URL: https://ui.adsabs.harvard.edu/abs/2022SPIE12187E..0FD

Review of

Series: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series