BIAS: a toolbox for benchmarking structural bias in the continuous domain

Author(s):: Vermetten, D.L.; Stein, B. van (0000-0002-0013-7969); Caraffini, F.; Minku, L.; Kononova, A.V. (0000-0002-4138-7024)

Published: 2021
Publication type: Research paper

Date issued: 2021-11-09
Language: English
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Is part of
hdl: 1887/3279994
doi: 10.36227/techrxiv.16594880