Full characterization of the instrumental polarization effects of the spectropolarimetric mode of SCExAO/CHARIS

Author(s):: 't Hart, J.G.J.; Holstein, R.G. van; Bos, S.P. (0000-0002-5911-4892); Ruigrok, J.; Snik, F. (0000-0003-1946-7009); Lozi, J.; Guyon, O.; Kudo, T.; Zhang, J.; Jovanovic, N.; Norris, B.; Martinod, M.A.; Groff, T.D.; Chilcote, J.; Currie, T.; Tamura, M.; Vievard, S.; Sahoo, A.; Deo, V.; Ahn, K.; Martinache, F.; Kasdin, J.

Editor(s):: Kupinski, M.K.; Shaw, J.A.; Snik F.

Published: 2021
Publication type: Article in monograph or in proceedings

Date issued: 2021-08-09
Language: English
Publisher: SPIE
Is part of: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series (2021), Pt. 11833, p. 118330O
ISBN source: 9781510645042
hdl: 1887/3270820
doi: 10.1117/12.2602859
URL: https://ui.adsabs.harvard.edu/abs/2021SPIE11833E..0OT

Review of

Series: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series

Conference

Meeting name: SPIE Optical Engineering and Applications 2021
Meeting location: San Diego, United States of America
Meeting date: 2021-08-01 - 2021-08-05