Comparing correction methods to reduce misclassification bias

Author(s):: Kloos, K.; Meertens, Q.; Scholtus, S.; Karch, J.D. (0000-0002-1625-2822)

Editor(s):: Baratchi, M.; Cao, L.; Kosters, W.A; . Lijffijt, J.; Rijn, J.N.; Takes, F.W.

Date issued: 2020-11-19
Language: English
Publisher: Springer International Publishing AG
Is part of: Artificial Intelligence and Machine Learning: 32nd Benelux Conference, BNAIC/Benelearn 2020, Leiden, The Netherlands, November 19–20, 2020, Revised Selected Papers (2020), p. 64-90
ISBN source: 9783030766399
hdl: 1887/3206637
doi: 10.1007/978-3-030-76640-5_5
URL: https://bnaic.liacs.leidenuniv.nl/wordpress/wp-content/uploads/bnaic2020proceedings.pdf#page=112