A comprehensive evaluation of local detectors and descriptors

Author(s):: Wu, S.; Oerlemans, A.; Bakker, E.M.; Lew, M.S.K. (0000-0003-4353-1840)

Published: 2017
Publication type: Article / Letter to editor

Date issued: 2017
Language: English
Is part of
hdl: 1887/3202483
doi: 10.1016/j.image.2017.06.010