Forensic potential of atomic force microscopy.

Author(s):: Smijs, T.; Galli, F. (0000-0002-1098-8150); Asten, A. van

Published: 2016
Publication type: Article / Letter to editor

Date issued: 2016-11-03
Language: English
Is part of
hdl: 1887/3199377
doi: 10.1016/j.forc.2016.10.005
URL: http://www.sciencedirect.com/science/article/pii/S2468170916300443