Optical near-field electron microscopy
- Author(s):
- Marchand, R.; Sachl, R.; Kalbac, M.; Hof, M.; Tromp, R.M.; Amaro, M.; Molen, S.J. van der (0000-0003-3181-2055); Juffmann, T.
- Published
- 2021
- Publication type
- Article / Letter to editor
- Date issued
- 2021
- Language
- English
- Is part of
- Physical Review Applied (2021), No. 1
- hdl
- 1887/3149351
- doi
- 10.1103/PhysRevApplied.16.014008
- URL
- https://arxiv.org/abs/2102.13010
