Euclid mission status after mission critical design
- Author(s):
- Laureijs, R.; Racca, G.D.; Mellier, Y.; Musi, P.; Brouard, L.; Boenke, T.; Gaspar Venancio, L.; Maiorano, E.; Short, A.; Strada, P.; Altieri, B.; Buenadicha, G.; Dupac, X.; Gomez Alvarez, P.; Hoar, J.; Kohley, R.; Vavrek, R.; Rudolph, A.; Schmidt, M.; Amiaux, J.; Aussel, H.; Berthe, M.; Cropper, M.; Cuillandre, J.-C.; Dabin, C.; Dinis, J.; Nakajima, R.; Maciaszek, T.; Scaramella, R.; da Silva, A.; Tereno, I.; Williams, O.R.; Zacchei, A.; Azzollini, R.; Bernardeau, F.; Brinchmann, J.; Brockley-Blatt, C.; Castander, F.; Cimatti, A.; Conselice, C.; Ealet, A.; Fosalba, P.; Gillard, W.; Guzzo, L.; Hoekstra, H. (0000-0001-7463-2893); Hudelot, P.; Jahnke, K.; Kitching, T.; Miller, L.; Mohr, J.; Percival, W.; Pettorino, V.; Rhodes, J.; Sanchez, A.; Sauvage, M.; Serrano, S.; Teyssier, R.; Weller, J.; Zoubian, J.
- Editor(s):
- Lystrup, M.; Perrin, M.D.; Batalha, N.; Siegler, N.; Tong, E.C.
- Published
- 2020
- Publication type
- Article in monograph or in proceedings
- Date issued
- 2020-12-13
- Language
- English
- Publisher
- SPIE
- Is part of
- Proceedings Volume 11443, Space Telescopes and Instrumentation 2020: Optical, Infrared, and Millimeter Wave (2020), Pt. 11443, p. 114430F
- ISBN source
- 9781510636736
- hdl
- 1887/3142244
- doi
- 10.1117/12.2563145
- URL
- https://ui.adsabs.harvard.edu/abs/2020SPIE11443E..0FL
Review of
- Series
- Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Conference
- Meeting name
- SPIE Astronomical Telescopes + Instrumentation 2020
- Meeting location
- Virtual Event
- Meeting date
- 2020-12-14 - 2020-12-18
