Complementary LEEM and eV-TEM for imaging and spectroscopy

Author(s):
Neu, P.S.; Geelen, D. (0000-0003-3571-3898); Thete, A.; Tromp, R.M.; Molen, S.J. van der (0000-0003-3181-2055)
Published
2021
Publication type
Article / Letter to editor
Date issued
2021-01-07
Language
English
Is part of
Ultramicroscopy (2021), Vol. 222, p. 113199
hdl
1887/3134650
doi
10.1016/j.ultramic.2020.113199