Imaging with Aberration-Corrected Low Energy Electron Microscopy

Author(s):
Schramm, S.M.
Published
2013
Publication type
Doctoral Thesis

Abstract

In this thesis we discuss imaging with aberration-corrected Low Energy Electron

Microscopy in theory as well as in the experiment.

LEEMPEEMAberration-correctionElectron microscopyContrast transfer function
Defense date
2013-04-25
Language
English
Supervisor(s)
Tromp, R.M.
Advisor(s)
Molen, S.J. van der
Committee member(s)
Horn-von Hoegen, M.; Hannon, J.B.; Watson, T.J.; Poelsema, B.; Frenken, J.W.M.; Ruitenbeek, J.M. van; Eliel, E.R.
Qualification
Ph.D.
Degree granting institution
Leiden Institute of Physics (LION), Faculty of Science, Leiden University, Leiden
hdl
1887/20843
ISBN(s)
9789085931522