A comparison of two techniques for bibliometric mapping: Multidimensional scaling and VOS

Author(s):: Eck, N.J.P. van (0000-0001-8448-4521); Waltman, L.R. (0000-0001-8249-1752); Dekker, R.; Van den Berg, J.

Published: 2010
Publication type: External research report

Date issued: 2010
Language: English
Publisher: Leiden: SW Centrum Wetensch. & Techn. Studies (CWTS)
hdl: 1887/15069

Review of

Series: CWTS Working Paper Series