How to measure and explain achievement change in large-scale assessments: A rejoinder

Author(s):: Hickendorff, M. (0000-0002-5024-421x); Heiser, W.J.; Putten, C.M. van; Verhelst, N.D.

Published: 2009
Publication type: Article / Letter to editor

Date issued: 2009
Language: English
Is part of: Psychometrika (2009), Vol. 74, p. 367-374
hdl: 1887/14281
doi: 10.1007/s11336-009-9124-1