Bias of two-level scalability coefficients and their standard errors

Author(s):
Koopman, L.; Zijlstra, B.J.H.; Rooij, M. de; Ark, L.A. van der
Published
2020
Publication type
Article / Letter to editor
Date issued
2020-05-01
Language
English
Is part of
Applied Psychological Measurement (2020), Vol. 44, no. 3, p. 197-214
Advanced publication
Yes
hdl
1887/136930
doi
10.1177/0146621619843821