Leiden University Scholarly Publications

Persistent URL of this record https://hdl.handle.net/1887/121962

Documents

In Collections

This item can be found in the following collections:

Krug J.R., Schadewijk R. van, Vergeldt F.J., Webb A.G., Groot H.J.M. de, Alia A., As H. van, Velders A.H. (2020)

Assessing spatial resolution, acquisition time and signal-to-noise ratio for commercial microimaging systems at 14.1, 17.6 and 22.3 T

Article / Letter to editor
All authors
Krug J.R., Schadewijk R. van, Vergeldt F.J., Webb A.G., Groot H.J.M. de, Alia A., As H. van, Velders A.H.
Date
2020
Journal
Journal of Magnetic Resonance
Volume
316
Pages
106770
DOI
doi:10.1016/j.jmr.2020.106770