Foil-hole and data image quality assessment in 3DEM: Towards high-throughput image acquisition in the electron microscope

Author(s):: Vargas, J.; Franken, E.; Sorzano, C.O.S.; Gomez-Blanco, J.; Schoenmakers, R.; Koster, A.J. (0000-0003-1717-2549); Carazo, J.M.

Published: 2016
Publication type: Article / Letter to editor

Cryoelectron microscopyData collectionImage quality

Date issued: 2016-12-31
Language: English
Is part of: Journal of Structural Biology (2016), Vol. 196, no. 3, p. 515-524
hdl: 1887/113476
doi: 10.1016/j.jsb.2016.10.006