Improved analysis of long STR amplicons from degraded single source and mixed DNA

Author(s):
Westen, A.A.; Gaag, K.J. van der; Knijff, P. de (0000-0002-0899-771X); Sijen, T.
Published
2013
Publication type
Article / Letter to editor
Forensic scienceShort tandem repeat (STR)Degraded DNAMixturesAMPure XP beadsPost-PCR purification
Date issued
2013-07-31
Language
English
Is part of
International Journal of Legal Medicine (2013), Vol. 127, no. 4, p. 741-747
hdl
1887/100123
doi
10.1007/s00414-012-0816-1